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Role of surface microgeometries on electron escape probability and secondary electron yield of metal surfaces - CERN Document Server

机译:CERN文件服务器 - 表面microgeometries对电子逸出概率和金属表面的二次电子产率的作用

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摘要

The influence of microgeometries on the Secondary Electron Yield (SEY) of surfaces is investigated. Laser written structures of different aspect ratio (height to width) on a copper surface tuned the SEY of the surface and reduced its value to less than unity. The aspect ratio of microstructures was methodically controlled by varying the laser parameters. The results obtained corroborate a recent theoretical model of SEY reduction as a function of the aspect ratio of microstructures. Nanostructures - which are formed inside the microstructures during the interaction with the laser beam - provided further reduction in SEY comparable to that obtained in the simulation of structures which were coated with an absorptive layer suppressing secondary electron emission.

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  • 作者单位
  • 年(卷),期 2020(),
  • 年度 2020
  • 页码
  • 总页数 8
  • 原文格式 PDF
  • 正文语种
  • 中图分类
  • 网站名称 欧洲核子研究中心机构库
  • 栏目名称 所有文件
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