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Application of Optical Theory to Quantitative Surface FT-IR with Emphasis on Molecular Depth Profiling.

机译：光学理论在定量表面FT-IR中的应用，重点是分子深度剖析。

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摘要

Applications of optical theory to the study of surface, thin films and coatings have been reviewed. Recent advances in personal computing has made the application of optical theory to an observed spectrum a nearly routine practice. With diversification of infrared techniques which rely on reflection techniques, band shape distortion and frequency shift are common occurrence and the ability to correct for the optical effects has become extremely useful. This article discusses selected topics to demonstrate the usefulness of the application of optical theory. Special emphasis is placed on the quantitative nature of the discussion as well as techniques related to molecular depth profiling.

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作者
Ishida, H.;
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年度 1992
页码 1-26
总页数 26
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Fourier spectroscopy; Infrared spectroscopy; Distortion; Frequency shift; Reflection; Surfaces; Theory; Thin films; Optical coatings; Molecular depth profiling;

机译：傅里叶光谱;红外光谱;畸变;频移;反射;表面;理论;薄膜;光学涂层;分子深度剖析;

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Application of Optical Theory to Quantitative Surface FT-IR with Emphasis on Molecular Depth Profiling.

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