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首页> 美国政府科技报告 >In-situ Surface X-ray Scattering Measurements of Electrochemically DepositedBismuth on Silver (III): Structure, Compressibility, and Comparison with Ex-situ Leed Measurements
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In-situ Surface X-ray Scattering Measurements of Electrochemically DepositedBismuth on Silver (III): Structure, Compressibility, and Comparison with Ex-situ Leed Measurements

机译：电化学沉积铋在银上的原位表面X射线散射测量（III）：结构，可压缩性和与非原位Leed测量的比较

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We report in-situ surface X-ray scattering measurements of the structure andcompressibility of electrochemically deposited Bi monolayers on Ag(III) and compare the in-situ structure with results from previous ex-situ experiments on emersed electrodes, where the structure was studied with low-energy diffraction (LEED). We find that the Bi monolayer forms an unusual structure: a two-dimensional rectangular lattice is uniaxially commensurate with the hexagonal Ag (III) surface along the Ag211 direction. There are two Bi adatoms per rectangular unit cell and one adatom is displaced from the centered-rectangular position by approx. 0.25a along the commensurate direction. The displacement shortens two of the Bi-Bi near-neighbor bond distances but lengthens two others and may reflect the tendency toward covalent bonding in Bi. With increasing coverage (Decreasing applied potential), the Bi monolayer compresses uniaxially along the incommensurate direction Ag011, which preserves the uniaxially commensurate structure.

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