Ellipsometers; Polymeric films; Anisotropy; Coatings; Complementary metal oxide semiconductors; Computerized simulation; Data bases; Films; Frequency; Glass; Indium compounds; Isotropism; Layers; Limitations; Optical properties; Organic materials; Oxides; Regions; Spectroscopy; Substrates; Thin films; Thiophenes; Tin compounds; Ellispsometry; Organic thin films; Polymer; Theses;
机译:光谱椭偏法测定溶胶凝胶衍生的Pb(Zr_xTi_(1-x))O_3薄膜的光学性能
机译:椭偏光谱法测定溶胶-凝胶衍生的BaxSr1-xTiO3薄膜的光学性能
机译:椭圆偏振光谱法研究夹在Nb掺杂TiO_2薄膜之间的超薄铜薄膜的光学性能
机译:椭圆偏振光谱法测定不同基材上二氧化钛薄膜的光学性能
机译:使用椭圆偏振光谱法对硒化铜(铟,镓)硒太阳能电池的光学特性进行建模。
机译:质子化诱导的无机 - 有机磷钼酸/聚苯胺杂交薄膜的增强光学光学光学性质
机译:基于光学的光谱方法,用于测量聚合物薄波导膜的化学,光学和物理性质