首页> 美国政府科技报告 >Industrial Technology Modernization Program. Phase 2, Project 82. Increase Efficiency of Card/Device Test Area by the Use of Modern Multi-Purpose Test Equipment. Revision 1
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Industrial Technology Modernization Program. Phase 2, Project 82. Increase Efficiency of Card/Device Test Area by the Use of Modern Multi-Purpose Test Equipment. Revision 1

机译:工业技术现代化计划。第二阶段,项目82.通过使用现代多用途测试设备提高卡/设备测试区域的效率。修订版1

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摘要

Multipurpose test equipment in the printed circuit card and completed device test areas will be used for functional acceptance test, troubleshooting, and burn-in operations. The use of this more modern equipment will result in increased productivity and test yields by a reduction in test execution and fault isolation time and by providing enhanced data collection and analysis resources. Keywords: Multi-purpose auto test equipment.

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