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Light Scattering Studies of Far Infrared Dielectric Properties of Semiconductors.

机译：半导体远红外介电性能的光散射研究。

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The main objective of this project was to characterize the linear and non-linear infrared optical properties of technically important semiconductors in varied sample geometries, such as bulk, near a surface and in film geometry. Surface polaritons and guided-wave polaritons in GaP and GaSe were studied by Raman scattering spectroscopy. Resonance Raman effects were investigated at the indirect gap of Ga P. The structure of amorphous Se-Ge glass was determined by Raman scattering. A double grating spectrometer and a Fabry-Perot interferometer were interfaced to an LSI-II minicomputer using a CAMAC system. Keywords: Infrared radiation; Infrared phenomena. (kt)

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作者
Ushioda, S.;
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年度 1982
页码 1-8
总页数 8
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Far infrared radiation; Light scattering; Semiconductors; Dielectric properties; Fabry perot interferometers; Films; Geometry; Gratings(Spectra); Infrared phenomena; Raman spectra; Raman spectroscopy; Resonance; Spectrometers; Gallium phosphides; Gallium selenides; Germanium; Selenium;

机译：远红外辐射;光散射;半导体;介电特性;法布里珀罗干涉仪;薄膜;几何;光栅（光谱）;红外现象;拉曼光谱;拉曼光谱;共振;光谱仪;磷化镓;硒化镓;锗;硒;

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Light Scattering Studies of Far Infrared Dielectric Properties of Semiconductors.

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