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High Accuracy Microwave S-Parameter Measurements on Solid State Devices.

机译：固态器件的高精度微波s参数测量。

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The absolute accuracy of automatic network analyzer measurement and de-imbedding of microwave S-parameters of solid state devices (diodes or transistors) is not easy to determine. A reasonable rule of thumb is that the fewer inaccurate measurements necessary to get at an answer, the more accurate the answer. The method outlined in this report, especially the low VSWR test equipment case (which uses only one measurement other than the one with the device in place), uses fewer measurements than any other method known. Because of this it is also possible that this measurement and de-imbedding method is the most accurate. (Author)

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