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Storage Reliability of Missile Materiel Program. Storage Reliability Analysis Summary Report. Volume I. Electrical and Electronic Devices.

机译:导弹装备计划的存储可靠性。存储可靠性分析摘要报告。第一卷电气和电子设备。

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This report summarizes analyses on the non-operating reliability of missile electrical and electronic devices. The analyses are part of a research program being conducted by the U. S. Army Missile R and D Command, Redstone Arsenal, Alabama. The objective of the program is the development of non-operating (storage) reliability prediction and assurance techniques for missile materiel. Included are analyses of integrated circuits, semiconductors, vacuum tubes, resistors, capacitors, inductive Devices, crystals, batteries connections, connectors and printed wiring boards. This report updates and replaces report LC-78-2 dated May 1976. (Author)

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