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首页> 美国政府科技报告 >Planar Near-Field Measurement Techniques on High Performance Arrays. Part I. Error Analysis for Nonscanning Beam Patterns.
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Planar Near-Field Measurement Techniques on High Performance Arrays. Part I. Error Analysis for Nonscanning Beam Patterns.

机译：高性能阵列的平面近场测量技术。第一部分非扫描光束模式的误差分析。

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摘要

General expressions are derived for estimating the errors in the sum or difference far-field pattern of electrically large aperture antennas which are measured by the planar near-field scanning technique. Upper bounds are determined for the far-field errors produced by (1) the nonzero fields outside the finite scan area, (2) the inaccuracies in the positioning of the probe, (3) the distortion and nonlinearities of the instrumentation which measures the amplitude and phase of the probe output, and (4) the multiple reflections. Computational errors, uncertainties in the receiving characteristics of the probe, and errors involved with measuring the input power to the test antenna are briefly discussed.

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