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Phase Matched Critical Total Reflection and The Goos-Haenchen Shift in Second Harmonic Generation

机译:相位匹配临界全反射和二次谐波产生中的Goos-Haenchen位移

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摘要

It is well established that a totally reflected light beam of finite diameter undergoes a lateral displacement, known as the Goos-Haenchen shift. The theory for the corresponding effect in nonlinear optics is presented. The special phase-matched case, in which both the fundamental and second harmonic are at critical total reflection, is shown to have a characteristic radiation pattern. Since the finite beam diameter is taken into account, divergencies of earlier theories are eliminated. (Author)

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