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Proceedings of the Annual Joint Militaryindustrial Electronic Test Equipment Symposium (4th), Held at the Museum of Science and Industry, Chicago, Illinois September 14 and 15, 1960

机译:1960年9月14日和15日在伊利诺伊州芝加哥市科学与工业博物馆举行的年度联合军事工业电子测试设备研讨会论文集(第4期)

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The symposium was presented to emphasize the advanced instrumentation techniques currently being developed to keep pace with expanding system requirements. The technical sessions were planned to be sufficiently diversified, both at the practical and more technical levels, in order to stimulate the exchange of information among the individuals present. Industrial and government representatives attended a total of seventeen technical presentations in addition to a luncheon address. The technical sessions presented such general topics as voltage and power measurements, microwave measurement techniques, systems measurements, and fault analysis. Specific papers provided technical data on a variety of instruments, measurement techniques, and analytical approaches to measurement problems.

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