DURIP: An Ultrafast Testbed for Comprehensive Characterization of Photonics, Electronic, and Optoelectronic Properties of Inegrated Nanophotonic Structures.

著录项

• 作者

  Adibi, A.;

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• 作者单位

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• 年度 2017
• 页码 1-21
• 总页数 21
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  Test beds; Electronics; Optoelectronics; Nanophotonics; Photonic devices; Semiconductors; Photonics; Modulators; Detectors; Digital signal processing; Graphene; Insertion loss; Lasers; P-n junctions; Amplifiers; Optoelectronic devices; Switches;

  机译：试验台;电子学;光电子学;纳米光子学;光子器件;半导体;光子学;调制器;探测器;数字信号处理;石墨烯;插入损耗;激光器; p-n结;放大器;光电器件;开关;