Probe Beam Deflection Optical Imaging of Thermal and mechanical Phenomena Resulting from Nanosecond Electric Pulse (nsEP) Exposure In-Vitro.

著录项

• 作者

  Barnes, R. A.; Roth, C. C.; Beier, H. T.; Noojin, G.; Valdez, C.; Bixler, J.; Moen, E.; Shadaram, M.; Ibey, B. L.;

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• 作者单位

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• 年度 2017
• 页码 1-24
• 总页数 24
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  Electromagnetic interference; Imaging techniques; Image reconstruction; Detectors; Electric fields; Nsep(nanosecond-duration electric pulses); Emi(electromagnetic interference); Pbdt(probe beam deflection technique);

  机译：电磁干扰;成像技术;图像重建;探测器;电场; Nsep（纳秒持续时间电脉冲）; Emi（电磁干扰）; pbdt（探测光束偏转技术）;