首页> 美国政府科技报告 >International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (4th) Held in Cardiff University, Cardiff, Wales on 21-24 of June 1998, EXMATEC '98
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International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (4th) Held in Cardiff University, Cardiff, Wales on 21-24 of June 1998, EXMATEC '98

机译:复合半导体材料与技术专家评估与控制国际研讨会(第四届)于1998年6月21日至24日在威尔士加的夫卡迪夫大学举行,EXmaTEC '98

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Partial contents: Latest developments in VGF technology: GaAs InP, and GaP; Photoelastic characterisation of residual strain in GaAs wafers annealed in different holder geometrics; Non destructive Mode index Measurement using Resonant Coupling; X-ray Characterisation of InP Substrates; Reliability issues due to hot electrons in GaAs and InP HEMTS; Optical and structural analysis of degraded high power in InGaAlAs/As/AlGaAs lasers; Failure analysis of heavily proton irradiated p+-n InGaP solar cells by EBIC and cathodoluminescence; Electron irradiation and thermal annealing effects on GaAs solar cells; Structural characterisation of InGaP/GaAs heterojunction bipolar transistors; III-Nitrides for Red and IR applications; Large area GaN substrates.

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