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首页> 美国政府科技报告 >Laboratory Tests on the Role of Impurities in Semiconducting Shield Materials on the Degradation of XLPE Cable Insulation.
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Laboratory Tests on the Role of Impurities in Semiconducting Shield Materials on the Degradation of XLPE Cable Insulation.

机译：半导体屏蔽材料中杂质对XLpE电缆绝缘降解的实验室试验。

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Analyses of field-aged and failed cables recovered from the field over the past fifteen years have contributed a great deal of information that has been compiled to gain a better understanding of failure mechanisms is direct buried (URD), medium voltage cables. The experience gained through these analyses strongly suggested that water and ions, acting with the applied electric field, were responsible for a large number of premature failures of URD cables. The type of cable construction, cleanliness of the raw materials, extrusion practices, and nature of the operating environment were shown to influence the rate of degradation. Experience gained through analysis of field aged cables, combined with laboratory tests, has resulted in significant and ongoing technology transfer to the electric utilities, cable materials suppliers, and cable manufacturers. 11 refs.

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