• 主题
高级搜索  >
历史搜索 清空历史
首页> 美国政府科技报告 >Detection of Near-Surface sup 52 Cr Segregation in Irradiated Sup 51 V(Cr) by RBS (Rutherford Backscattering Spectrometry)
【24h】

Detection of Near-Surface sup 52 Cr Segregation in Irradiated Sup 51 V(Cr) by RBS (Rutherford Backscattering Spectrometry)

机译：RBs（卢瑟福背散射光谱法）检测辐照sup 51 V（Cr）中近表面sup 52 Cr偏析

获取原文
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Irradiation at elevated temperatures of V(Cr) alloys is known to create a near-surface layer of nonequilibrium Cr enrichment. Highly reproducible RBS spectra were accumulated from a V-15%Cr alloy irradiated at 750 deg C, and from unirradiated portions of the same specimen. Differences between these spectra are used to demonstrate the high sensitivity of conventional RBS techniques for determining near-surface segregation behavior. Sensitivities obtained utilizing differences in the acquired spectra are much higher than those typically assumed for RBS measurements. Using 1.8 MeV sup 4 He, and conventional RBS equipment and scattering geometries, segregation of less than or equal to2 atomic layers of sup 52 Cr in sup 51 V-15 at. %Cr over a depth of approx.5 nm has been observed. (ERA citation 12:016257)

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号