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首页> 美国政府科技报告 >Impact of SB4 Tank 40 Decant and ARP/MCU Additions with/without Added Caustic on DWPF CPC Performance
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Impact of SB4 Tank 40 Decant and ARP/MCU Additions with/without Added Caustic on DWPF CPC Performance

机译：具有/不具有添加焦散的sB4 Tank 40 Decant和aRp / mCU添加对DWpF CpC性能的影响

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The Savannah River National Laboratory (SRNL) was requested to investigate the impact of decanting supernate from the Sludge Batch four (SB4) feed in Tank 40. The specific questions concerned the potential impact on the stoichiometric acid window determined for SB4 with respect to overall hydrogen generation rates, nitrite destruction in the Sludge Receipt and Adjustment Tank (SRAT) and the rheology of the sludge, SRAT product, and Slurry Mix Evaporator (SME) product slurries. The scope included considering an addition of sodium hydroxide to Tank 40 to partially offset the sodium lost during decanting as well as considering the impact of bounding quantities of Actinide Removal Process (ARP) feed and Modular Caustic-Side Solvent Extraction Unit (MCU) feed on these same parameters. Simulated SB4 waste was first adjusted to match the dilution that has occurred in Tank 40 during the initial period of SB4 operations in the DWPF. The adjusted simulant was decanted an equivalent of 100,000 gallons relative to 413,740 gallons projected supernate volume. The decanted simulant was divided into two equal parts. One part received an addition of sodium hydroxide to increase the Na(sub 2)O content of the calcined sludge solids by about 3%. The baseline decanted simulant and caustic adjusted simulant were each tested in three pairs of DWPF process simulations of the SRAT and SME cycles. The simulations were at the nominal SB4 acid stoichiometry of 130% with and without bounding ARP/MCU additions and at 170% of acid without ARP/MCU. The 170% case without ARP/MCU was considered bounding relative to 170% with ARP/MCU based on calculated acid requirements.

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