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Beam Diagnostics Via Model Independent Analysis of the Turn-by-Turn BPM Data

机译:通过模型独立分析转弯Bpm数据进行光束诊断

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摘要

Model independent analysis (MIA) can be used to obtain all the eigen modes included in the turn-by-turn BPM data. Not only the synchrotron tune and betatron tune can be obtained from the fast Fourier transforms (FFT) of the temporal eigen vector of the corresponding mode, but also the error mode, which could be caused by the different gain of a BPM, can be observed in both the temporal and spatial eigen vectors of the error mode. It can be applied as a diagnostic tool for Booster.

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