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首页> 美国政府科技报告 >Application of Z-contrast imaging to obtain column-by-column spectroscopic analysis of materials.
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Application of Z-contrast imaging to obtain column-by-column spectroscopic analysis of materials.

机译：应用Z-对比成像获得材料的逐列光谱分析。

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Z-contrast imaging has been shown to be an effective method for obtaining a high-resolution image from a scanning transmission electron microscope (STEM). The incoherent nature of the high-angle scattering makes image interpretation straightforward and intuitive with the resolution limited only by the 2.2 (Angstrom) electron probe. The optimum experimental conditions for Z-contrast imaging also coincide with those used for analytical microscopy, enabling microanalysis to be performed with the same spatial resolution as the image. The detection limits afforded by a parallel detection system for electron energy loss spectroscopy (EELS) allows column-by-column core-loss spectroscopy to be performed using the Z-contrast image to position the electron probe. Preliminary results from the study of YBa(sub 2)Cu(sub 3)O(sub 7-(delta)) illustrate the spatial resolution available with this technique and the potential applications for materials science.

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