Programmable Logic Tester

机译：可编程逻辑测试仪

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A high speed static tester consisting mainly of storage and decoding was developed which is capable of performing a simple GO/NO GO test of logic ciruity. The device is computer driven with all decision making, comparison, and sequencing under program control. The terminal, its operation, and the program description are described.

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作者
Gale, N.;
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年度 1970
页码 1-28
总页数 28
原文格式 PDF
正文语种 eng
中图分类工业技术;
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7. Learning logic programs with structured background knowledge☆☆An extended abstract of this paper appeared in: L. De Raedt (Ed.), Proceedings of the Fifth International Workshop on Inductive Logic Programming, Tokyo, Japan, 1995, pp. 53–76, Scientific Report of the Department of Computer Science, Katholieke Universiteit Leuven, and also in the post-conference volume: L. De Raedt (Ed.), Advances in Inductive Logic Programming, IOS Press, Amsterdam/Ohmsha, Tokyo, 1996, pp. 172–191. [O] . Horváth Tamás, Turán György 2001

机译：具有结构化背景知识的学习逻辑程序☆☆本文的扩展摘要发表在：L.De Raedt（Ed。），第五届国际归纳逻辑编程研讨会论文集，日本东京，1995年，第53-76页，鲁汶大学（Keholieke Leuven）计算机科学系的科学报告，以及会议后论文集：L.De Raedt（Ed。），归纳逻辑程序设计进展，IOS出版社，阿姆斯特丹/欧姆沙，东京，1996年，第pp。 172–191。

Programmable Logic Tester

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