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Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devices

机译：加速寿命测试和Gaas CHFET器件中器件特性的温度依赖性

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摘要

Accelerated life testing of GaAs complementary heterojunction field effect transistors (CHFET) was carried out. Temperature dependence of single and synchronous rectifier CHFET device characteristics were also obtained.

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作者
Gallegos, M.; Leon, R.; Vu, D. T.; Okuno, J.; Johnson, A. S.;
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年度 2002
页码 1-12
总页数 12
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
ACCELERATED LIFE TESTS; FIELD EFFECT TRANSISTORS; GALLIUM ARSENIDES; HETEROJUNCTIONS; RECTIFIERS; TEMPERATURE DEPENDENCE; CHFET GaAs devices III-V devices III-V temperature dependence;

机译：加速生命测试;场效应晶体管; GaLLIUm aRsENIDEs;异质结;整流器;温度依赖; CHFET Gaas器件III-V器件III-V温度依赖性;

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1. GaAs substrate orientation dependence of resonant quasi-level lifetime in 2D-2D InGaAs/GaAs resonant tunneling devices [J] . L. Bouzaieene, N. Imbarek, L. Sfaxi, Microelectronics journal . 2006,第9期

机译：2D-2D InGaAs / GaAs共振隧穿器件中共振准能级寿命的GaAs衬底取向依赖性
2. Temperature dependence of characteristics of characteristics of SrS : Cu(Ag) thin-film electroluminescent devices beyond room temperature [J] . N.A. Vlasenko, Ya.F. Kononets, Yu.V. Kopytko Journal of Crystal Growth . 2000,第1a4期

机译：室温以上SrS：Cu（Ag）薄膜电致发光器件的特性与温度的关系
3. Temperature dependence of InAs/GaAs quantum dots solar photovoltaic devices [J] . E. Garduno-Nolasco, M. Missous, D. Donoval, Journal of Semiconductors . 2014,第5期

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4. The Modeling of Hydrogen-related Degradation of GaAs Devices during Accelerated Life Tests [C] . Yang Chen, Zhang Sujuan International conference on computer and network technology . 2011

机译：加速寿命试验中GaAs器件氢相关降解的建模
5. Finite element modeling and analysis of accelerated pavement testing devices and rutting phenomenon. [D] . Hua, Jianfeng. 2000

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6. Bipolar Effects in Photovoltage of Metamorphic InAs/InGaAs/GaAs Quantum Dot Heterostructures: Characterization and Design Solutions for Light-Sensitive Devices [O] . Sergii Golovynskyi, Luca Seravalli, Oleksandr Datsenko, 2017

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7. Thermo-mechanical analysis of GaAs devices under temperature-humidity-bias testing [O] . Adokanou Kokou, Inal Karim, Montmitonnet Pierre, 2015

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Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devices

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