首页> 美国政府科技报告 >Analyse der Strom-Spannungs-Kennlinien von Metall-Isolator-Zinntellurid Sandwichstrukturen (Analysis of the Voltage-Current Characteristics of Metal-Isolator-Tin-Telluride Sandwich Structures)
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Analyse der Strom-Spannungs-Kennlinien von Metall-Isolator-Zinntellurid Sandwichstrukturen (Analysis of the Voltage-Current Characteristics of Metal-Isolator-Tin-Telluride Sandwich Structures)

机译:分析der strom-spannungs-Kennlinien von metall-Isolator-Zinntellurid sandwichstrukturen(金属隔离器 - 锡 - 碲化物夹层结构的电压 - 电流特性分析)

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Metal-aluminum oxide-SnTe sandwich structures were produced by molecular beam epitaxy and optimized using electron-optics investigations. Macro- and micro-structures, especially in the first and second derivatives of the voltage-current characteristics, were measured using high resolution tunnel spectroscopy. In tunnel diodes, with a thermally grown Al2O3 isolator layer, a large number of structures was observed which have their origin very probably in the critical point of the SnTe energy band structure. Theoretical band structure calculations show good or satisfactory agreement. The position of the Fermi energy with respect to the critical point is almost independent of the nominal hole concentration; possible theoretical explanations are discussed.

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