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New Measurement Method of the Noise Parameters of Two-Port Devices

机译:双端口器件噪声参数测量新方法

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摘要

Available noise power is detected at device output with a sliding short circuit connected to its input terminals to determine the four noise parameters. Conventional methods suffer from inaccuracies due to the quality of the turners employed. In the method described a relationship is found between the device input impedance and the optimum source impedance for minimum noise figure. The experimental setup and measuring results in the 8 to 11 GHz band are described.

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