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Silicon-based polarization analyzer by polarization-frequency mapping

机译：基于硅基偏振分析仪通过偏振频率映射

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Measuring states of polarizations (SOPs) is a fundamental requirement in high capacity optical communications, optical imaging, and material characterization. However, most of the existing methods focused on the assembly of spatial optical elements, making the system bulky and complex. Alternatively, the integrated methods were mainly presented by plasmonic nanostructures or metasurfaces, difficult to integrate with commonly used silicon photonic devices. For large-scale inter-chip optical interconnections, the silicon-based polarization analyzers are in demand and in its infancy. Here, a silicon-based polarization analyzer by polarization-frequency mapping is put forward. The basis vectors of polarization are mapped to two frequencies by thermally tuned phase shifters. The SOPs are retrieved from the frequency domain. The proposed polarization analyzer is demonstrated experimentally and can measure SOPs in the entire C-band. The scheme is compatible with the CMOS fabrication process, making it possible to be integrated with other silicon-based devices monolithically.
机译：偏振的测量状态（SOP）是高容量光通信，光学成像和材料表征的基本要求。然而，大多数现有方法集中在空间光学元件的组装上，使系统庞大和复杂。或者，综合方法主要由等离子体纳米结构或弥补件呈现，难以与常用的硅光子器件集成。对于大规模的片间光学互连，硅基偏振分析仪是需求和初期的。这里，提出通过偏振频率映射的基于硅基偏振分析仪。通过热调节相移器映射到两个频率的基载体。 SOP从频域中检索。实验证明了所提出的偏振分析仪，可以测量整个C波段的SOP。该方案与CMOS制造工艺兼容，使得可以与其他基于硅基的装置集成在一起。

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