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Probing the electronic properties and charge state of gold nanoparticles on ultrathin MgO versus thick doped CaO films

机译：探讨超薄MgO对厚掺杂CaO膜的金纳米粒子的电子性质和充电状态

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Electron transfer into metal nanoparticles on oxide supports is associated with unusual morphological, electronic, and chemical properties of the charged system. Two fundamental charging routes have been identified so far, which are electron tunneling through ultrathin oxide films supported by a bulk metal and charge donation from single-ion impurities embedded in the oxide matrix. In this study, we have investigated whether both routes lead to the formation of metal deposits with identical properties. For this purpose, Au islands have been prepared on 1−2ML thin MgO/Ag(001) layers and on 25-ML-thick CaO films doped with Mo impurities. The morphological and electronic properties of the islands were analyzed with low-temperature scanning tunneling microscopy (STM) and spectroscopy. In both systems, pronounced electron confinement effects are observed in the nanostructures, arising from the quantization of one and the same Au electronic band. Moreover, clear experimental signatures for a charge transfer into the islands are found, such as a layer-by-layer growth of the ad-metal and a negative contrast of the oxide region around the deposits in STM images. Our data provide evidence that the charged nanostructures exhibit comparable properties independent of the origin of the extra electrons. This agreement suggests that ultrathin oxide films may be used as model systems for doped bulk oxides, as used in heterogeneous catalysis.
机译：电子转移到氧化物支撑件上的金属纳米颗粒与带电系统的异形态，电子和化学性质相关。到目前为止已经确定了两个基本充电路线，这是通过由块状金属和嵌入在氧化物基质中的单离子杂质支撑的超薄氧化物膜的电子隧道。在这项研究中，我们研究了两条路线是否导致金属沉积物的形成具有相同的性质。为此目的，Au岛已在1-2ml薄MgO / Ag（001）层上制备，并掺杂有Mo杂质的25ml厚的CaO膜。用低温扫描隧道显微镜（STM）和光谱分析岛的形态和电子性质。在两个系统中，在纳米结构中观察到明显的电子监禁效果，由一个和同一个AU电子频带的量化产生。此外，发现了用于电荷转移到岛中的透明实验特征，例如逐层涂层的层生长和STM图像中沉积物周围的氧化物区域的负对对比度。我们的数据提供了有证据表明电荷的纳米结构表现出与额外电子的起源无关的可比性。本协议表明，如在异质催化中所用的掺杂散装氧化物的模型系统可以用作模型系统。

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