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Characterization of Si/Si_(1-y)C_y superlattices grown by surfactant assisted molecular beam epitaxy

机译:表面活性剂辅助分子束外延生长Si / Si_(1-y)C_y超晶格的表征

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摘要

Si/Si_(0.97)C_(0.03) superlattices grown on Si(001) substrates by Sb surfactant assisted molecular beam epitaxy are characterized by in situ reflection high energy electron diffraction (RHEED), atomic force microscopy, transmission electron microscopy (TEM), and high resolution x‐ray diffraction. The RHEED shows that, in the absence of Sb, the growth front roughens during Si_(0.97)C_(0.03) growth and smooths during subsequent Si growth. In contrast, when Sb is present, the growth front remains smooth throughout the growth. This observation is confirmed by cross‐sectional TEM, which reveals that for samples grown without the use of Sb, the Si/Si_(0.97)C_(0.03) interfaces (Si_(0.97)C_(0.03) on Si) are much more abrupt than the Si_(0.97)C_(0.03)/Si interfaces. In the case of Sb assisted growth, there is no observable difference in abruptness between the two types of interfaces. Atomic force microscopy micrographs of the Si_(0.97)C_(0.03) surface reveal features that could be the source of the roughness observed by RHEED and TEM.
机译:通过Sb表面活性剂辅助分子束外延生长在Si(001)衬底上生长的Si / Si_(0.97)C_(0.03)超晶格的特征在于原位反射高能电子衍射(RHEED),原子力显微镜,透射电子显微镜(TEM),和高分辨率X射线衍射。 RHEED显示,在没有Sb的情况下,生长前沿在Si_(0.97)C_(0.03)生长期间变粗糙,而在随后的Si生长过程中趋于平滑。相反,当存在Sb时,生长前沿在整个生长过程中保持平稳。横截面TEM证实了这一观察,该结果表明,对于不使用Sb生长的样品,Si / Si_(0.97)C_(0.03)界面(Si上Si_(0.97)C_(0.03)的突变要大得多。比Si_(0.97)C_(0.03)/ Si接口。在Sb辅助生长的情况下,两种界面之间的突变率没有明显的差异。 Si_(0.97)C_(0.03)表面的原子力显微镜照片揭示了可能是通过RHEED和TEM观察到的粗糙度来源的特征。

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