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High-Isolation Dual-Polarized Microstrip Antenna via Substrate Integrated Waveguide Technology

机译:通过基片集成波导技术的高隔离度双极化微带天线

摘要

A dual-polarized microstrip antenna with high-isolation is proposed by the utilization of the substrate-integrated waveguide (SIW) technology. According to the SIW technology, the metalized holes (MHs) are inserted into the substrate for the proposed antenna and the electric fields of the feeding parts are enclosed, so the isolation of the antenna is enhanced. The bandwidth is improved due to the MHs in the four sides of the antenna. A prototype of the proposed antenna has been fabricated and measured. Experimental results indicate that the antenna obtains the isolation more than 40 dB and achieves the impedance bandwidth of 21.9% and 23.8%(11.8-14.6 GHz and 11.65-14.8 GHz for two ports) of the reflection coefficients less than -20 dB. The cross polarization with the main lobe remains less than -30 dB and the half-power beam width is about 70° for the proposed antenna. Meanwhile, the front-to-back ratio remains to be better than 20 dB. A good agreement between the measured and simulated results validates the proposed design.
机译:利用衬底集成波导技术,提出了一种高隔离度的双极化微带天线。根据SIW技术,将金属化孔(MH)插入拟议天线的基板中,并封闭馈电部分的电场,从而增强了天线的隔离度。由于天线四个侧面的MH,带宽得到了改善。所提出的天线的原型已被制造和测量。实验结果表明,该天线可获得大于40 dB的隔离度,并实现了反射系数小于-20 dB的21.9%和23.8%(两个端口分别为11.8-14.6 GHz和11.65-14.8 GHz)的阻抗带宽。对于建议的天线,主瓣的交叉极化保持小于-30 dB,半功率波束宽度约为70°。同时,前后比率仍然要好于20 dB。测量结果和模拟结果之间的良好一致性验证了所提出的设计。

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