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Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods

机译：用原子分辨率Z-对比成像和EELs结合第一性原理方法研究si3N4 / CeO2-δ界面的原子结构

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7. ATOMIC RESOLUTION Z-CONTRAST IMAGING OF INTERFACES [O] . 2014

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Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods

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