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DISPOSITIF DE TEST DE MATÉRIEL ET PROCÉDÉ DE TEST DE MATÉRIEL
DISPOSITIF DE TEST DE MATÉRIEL ET PROCÉDÉ DE TEST DE MATÉRIEL
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摘要
Proposed are a hardware testing device and a hardware testing method capable of minimizing the possibility of a secondary fault, even in the existence of a primary fault, in the testing of hardware. A hardware testing device 10 comprises a test list of a plurality of test cases to be executed in hardware to be tested 30, a fault list describing faults that may occur and their fault rate, a fault injection test result table describing the test results of simulation tests performed by a simulation testing device 20 and existence of any secondary faults, a real machine testing unit for executing a real machine test based on the test case, and a test selection unit for determining the test case to be subsequently executed by the real machine testing unit. The test selection unit calculates a parameter related to a secondary fault for each of the unexecuted test cases based on contents of the fault injection test result table and the fault list, and determines a priority of the unexecuted test cases based on the parameter related to the calculated secondary fault.
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