• 主题
高级搜索  >
历史搜索 清空历史
首页> 外国专利> ACTIVE COOLED DEVICE FOR RESEARCH OF DEFORMATION OF POLYMERIC MATERIALS AT LOW TEMPERATURES BY ATOMIC-POWER MICROSCOPY

ACTIVE COOLED DEVICE FOR RESEARCH OF DEFORMATION OF POLYMERIC MATERIALS AT LOW TEMPERATURES BY ATOMIC-POWER MICROSCOPY

机译：原子能显微镜研究低温下高分子材料变形的主动冷却装置

页面导航
  • 摘要
  • 著录项
  • 相似文献

摘要

The utility model relates to the study of materials using an atomic force microscope (AFM) and can be used to study surface rearrangements that occur during the deformation of various materials at low temperatures. The claimed device, comprising a housing with a stretching mechanism, a Peltier element and a water block, is designed so that the test (deformable) sample fits snugly on a copper table attached to the Peltier element, the water block is tightly attached to the heated side, providing intense heat dissipation, which allows to increase the temperature difference between the sides of the Peltier element, necessary to achieve the lowest possible temperatures of the test sample. The technical result is the expansion of the possibility of studying the deformation of materials using AFM, in particular, providing the possibility of studying low-temperature deformation of the material at the lowest possible temperatures. 2 ill.
机译：本实用新型涉及使用原子力显微镜（AFM）对材料进行研究，可用于研究在低温下各种材料变形过程中发生的表面重排。所要求保护的设备包括带有拉伸机构的外壳，珀尔帖元件和水冷块，其设计使得测试（可变形）样品紧贴地安装在连接到珀尔帖元件上的铜制工作台上，水冷块紧紧地附着在玻璃板上。加热侧，可提供强大的散热能力，这可以增加珀耳帖元件两侧之间的温差，这是实现测试样品尽可能低的温度所必需的。技术成果是扩大了使用原子力显微镜研究材料变形的可能性，特别是提供了在最低可能温度下研究材料的低温变形的可能性。 2病

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号