首页> 外国专利> METHOD FOR DETERMINING OPTIMAL PARAMETERS USED FOR SIMULTANEOUS MEASUREMENT OF TWO-DIMENSIONAL TEMPERATURE AND CONCENTRATION DISTRIBUTION OF GAS BASED ON TOMOGRAPHY AND APPARATUS THEREOF

METHOD FOR DETERMINING OPTIMAL PARAMETERS USED FOR SIMULTANEOUS MEASUREMENT OF TWO-DIMENSIONAL TEMPERATURE AND CONCENTRATION DISTRIBUTION OF GAS BASED ON TOMOGRAPHY AND APPARATUS THEREOF

机译:基于层析成像和装置的气体二维温度和浓度分布同时测定最佳参数的确定方法

摘要

The present invention relates to a method for determining optimal parameters used for simultaneous measurement of two-dimensional temperature and concentration distribution of gas based on tomography, and an apparatus thereof. According to the present invention, the method for determining optimal parameters used for simultaneous measurement of two-dimensional temperature and concentration distribution of gas based on tomography comprises the steps of: calculating an absorption amount and a line width expansion value; modifying a gain parameter, an exponent parameter, a line width gain parameter, and a line width exponent parameter, respectively; and determining optimal parameters. According to the present invention, a result with high accuracy can be obtained by minimizing variables.;COPYRIGHT KIPO 2020
机译:本发明涉及基于断层摄影术确定用于同时测量二维温度和气体浓度分布的最佳参数的方法及其设备。根据本发明,用于确定基于层析成像的同时测量二维温度和气体浓度分布的最佳参数的方法包括以下步骤:计算吸收量和线宽膨胀值;分别修改增益参数,指数参数,线宽增益参数和线宽指数参数;并确定最佳参数。根据本发明,通过最小化变量可以获得高精度的结果。COPYRIGHT KIPO 2020

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