首页> 外国专利> TCR TiO2/Cu Fabrication of TiO2/Cu hybrid composite films with near zero TCR and high adhesive strength via aerosol deposition

TCR TiO2/Cu Fabrication of TiO2/Cu hybrid composite films with near zero TCR and high adhesive strength via aerosol deposition

机译:TCR TiO2 / Cu通过气溶胶沉积制备具有接近零的TCR和高粘合强度的TiO2 / Cu杂化复合膜

摘要

A method of manufacturing a TiO 2 /Cu composite composite film having near zero TCR and high bonding strength through aerosol deposition is disclosed. Room-temperature processing of TiO 2 /Cu composite films for embedded passive devices was attempted through an aerosol deposition process. Since the initial TiO 2 Effect of particle size in the densified (densification) of the internal microstructure of the TiO 2 / Cu composite film by means of XRD analysis and the observation of the internal microstructure, 500 nm- size TiO 2 compared to 25 nm- size TiO 2 It was shown that the TiO 2 /Cu composite film using was stronger bonding between particles. Then, in order to optimize the bonding strength and resistance temperature coefficient (TCR), the electrical and mechanical properties of TiO 2 (500 nm)/Cu composite films with different contents of TiO 2 were evaluated for application as advanced composite film resistance. . As a result, TiO 2 / Cu (50 wt % / 50 wt%) composite film is sufficient degree (electrical resistivity) electrical resistance goes from a suitable co-existence of the anchoring bond and mechanical interlock to be formed during the aerosol deposition (5.8x10 -3 Ωcm) , Excellent near-zero TCR (-3ppm/°C), and improved adhesive strength (~7.37N/mm 2 ).
机译:公开了一种通过气溶胶沉积制备具有接近零TCR和高结合强度的TiO 2 / Cu复合复合膜的方法。尝试通过气溶胶沉积工艺对嵌入式无源器件的TiO 2 / Cu复合膜进行室温处理。由于初始TiO 2 的粒径效应,X射线衍射(XRD)分析和观察证实了TiO 2 / Cu复合薄膜内部微观结构的致密化(致密化)。内部结构,500 nm尺寸的TiO 2 与25 nm尺寸的TiO 2 使用时颗粒之间的结合更牢固。然后,为了优化键合强度和电阻温度系数(TCR),采用不同含量的TiO 2 <评估/ Sub>作为高级复合膜电阻的应用。 。作为结果,TiO 2 / Cu(50 wt %/ 50 wt%)复合膜具有足够的程度(电阻率),电阻从锚固键和机械互锁的适当共存变为在气溶胶沉积过程中形成(5.8x10 - 3 Ωcm),优异的接近零的TCR(-3ppm /°C)和改善的粘合强度(〜7.37N /毫米 2 )。

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