SYSTEM CHIP, AND BUILT-IN SELF-TEST CIRCUIT AND SELF-TEST METHOD THEREOF

• 1. 内置自测试电路和包括内置自测试电路的温度测量电路 [P] . 中国专利： CN113049129A . 2021-06-29
• 2. 有自测试能力的集成电路装置和对集成电路自测试的方法 [P] . 中国专利： CN108072827A . 2018-05-25
• 3. System chip, and built-in self-test circuit and self-test method thereof [P] . US11061072B2 . 2021-07-13

  机译： 系统芯片，内置自测电路及其自测方法

• 4. METHOD FOR GENERATING TEST SET FOR SCANNING METHOD 3 WEIGHT RANDOM BUILT-IN SELF-TEST AND SCANNING METHOD BUILT-IN SELF-TEST CIRCUIT [P] . 日本专利： JP2002286810A . 2002-10-03

  机译： 生成用于扫描方法3重量随机内置自测试和扫描方法内置自测试电路的测试集的方法

• 5. BUILT-IN SELF-TEST SYSTEM FOR VLSI CIRCUIT CHIPS. [P] . 欧洲知识产权局专利： EP0245463A4 . 1989-05-26

  机译： 用于VLSI电路芯片的内置自测系统。

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