首页> 外国专利> Active device which has a high breakdown voltage, is memory-less, traps even harmonic signals and circuits used therewith

Active device which has a high breakdown voltage, is memory-less, traps even harmonic signals and circuits used therewith

机译:击穿电压高的有源器件无存储器,甚至可以捕获谐波信号和与其一起使用的电路

摘要

An active device and circuits utilized therewith are disclosed. In an aspect, the active device comprises an n-type transistor having a drain, gate and bulk and a p-type transistor having a drain, gate and bulk. The n-type transistor and the p-type transistor include a common source. The device includes a first capacitor coupled between the gate of the n-type transistor and the gate of the p-type transistor, a second capacitor coupled between the drain of the n-type transistor and the drain of p-type transistor and a third capacitor coupled between the bulk of the n-type transistor and the bulk of p-type transistor. The active device has a high breakdown voltage, is memory less and traps even harmonic signals.
机译:公开了一种有源器件和与其一起使用的电路。在一方面,有源器件包括具有漏极,栅极和块体的n型晶体管以及具有漏极,栅极和块体的p型晶体管。 n型晶体管和p型晶体管包括公共源极。该器件包括耦合在n型晶体管的栅极与p型晶体管的栅极之间的第一电容器,耦合在n型晶体管的漏极与p型晶体管的漏极之间的第二电容器以及第三电容器。电容器耦合在n型晶体管的主体和p型晶体管的主体之间。有源器件的击穿电压高,存储量少,甚至可以捕获谐波信号。

著录项

  • 公开/公告号US10566942B2

    专利类型

  • 公开/公告日2020-02-18

    原文格式PDF

  • 申请/专利权人 ETHERTRONICS INC.;

    申请/专利号US201916456327

  • 发明设计人 FARBOD ARAM;

    申请日2019-06-28

  • 分类号H03F3/191;H03G1;H03F3/45;H03F1/56;H03F3/21;H03F1/26;H03F1/02;H03F3/193;H03F1/32;

  • 国家 US

  • 入库时间 2022-08-21 11:29:35

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