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Manufacturing process analysis device, manufacturing process analysis method, and manufacturing process analysis program

机译:制造过程分析装置,制造过程分析方法和制造过程分析程序

摘要

Provided is a manufacturing process analysis device (30), comprising: a computation unit (31) which computes, in a process in which a manufactured object is manufactured, invariant compliance strengths for each shift time for manufacturing condition values (360) and quality values (361) which are measured in time series; a shift time specification unit (32) which derives, as a specified shift time, a shift time for which the invariant compliance strengths satisfy a baseline; and an analysis unit (33) which analyzes the state of the manufacturing process on the basis of the quality value and the manufacturing condition value for the time which is earlier by the specified shift time than the time at which the quality value is measured.
机译:提供一种制造过程分析装置(30),其包括:计算单元(31),其在制造制造对象的过程中针对制造条件值(360)和质量值的每个班次时间计算不变的柔顺强度。 (361)按时间顺序衡量;换档时间指定单元(32),将不变的柔顺强度满足基线的换档时间作为指定的换档时间导出;分析单元(33)基于质量值和制造条件值来分析制造过程的状态,该时间比测量质量值的时间早指定的移位时间。

著录项

  • 公开/公告号JP6737277B2

    专利类型

  • 公开/公告日2020-08-05

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP20170532379

  • 发明设计人 河合 孝純;落合 勝博;

    申请日2016-08-02

  • 分类号G05B19/418;

  • 国家 JP

  • 入库时间 2022-08-21 11:32:31

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