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Manufacturing process analysis device, manufacturing process analysis method, and manufacturing process analysis program
Manufacturing process analysis device, manufacturing process analysis method, and manufacturing process analysis program
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机译:制造过程分析装置,制造过程分析方法和制造过程分析程序
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摘要
Provided is a manufacturing process analysis device (30), comprising: a computation unit (31) which computes, in a process in which a manufactured object is manufactured, invariant compliance strengths for each shift time for manufacturing condition values (360) and quality values (361) which are measured in time series; a shift time specification unit (32) which derives, as a specified shift time, a shift time for which the invariant compliance strengths satisfy a baseline; and an analysis unit (33) which analyzes the state of the manufacturing process on the basis of the quality value and the manufacturing condition value for the time which is earlier by the specified shift time than the time at which the quality value is measured.
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