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Distortion measuring device, distortion measuring method and distortion measuring program
Distortion measuring device, distortion measuring method and distortion measuring program
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机译：变形测量装置，变形测量方法和变形测量程序
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摘要
PROBLEM TO BE SOLVED: To provide a distortion measurement device and the like that add specific phosphor to a stress light emitting substance, and can quantitatively measure a distortion occurring in an object without relying upon a thickness of the coated stress light emitting substance or a surface color thereof.SOLUTION: A distortion measurement device 100 includes: an acquisition unit 101 that acquires a first photographed image photographing a fluorescent state of phosphor to be included in the stress light emitting substance when a stress light emitting substance coated on an object 110 transits to an excitation state, and a second photographed image photographing a light emitting state of the stress light emitting substance when a load is applied to the object; a measurement unit 102 that measures the fluorescent state of the phosphor on the basis of the first photographed image, and light emitting intensity of the stress light emitting substance on the basis of the second photographed image; and a calculation unit 103 that alters the light emitting intensity on the basis of the fluorescent state.SELECTED DRAWING: Figure 1
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