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Probe for magnetic force microscope for measuring strong magnetic field and measuring magnetic field value, and method and apparatus for observing magnetic field of sample generating strong magnetic field
Probe for magnetic force microscope for measuring strong magnetic field and measuring magnetic field value, and method and apparatus for observing magnetic field of sample generating strong magnetic field
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机译：用于测量强磁场和测量磁场值的磁力显微镜探头以及用于观察产生强磁场的样品的磁场的方法和装置
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摘要
Provided are: (1) a magnetic force microscope probe provided with at least one magnetic material, the magnetic material being such that, over a temperature range of at least 10-30°C, saturation magnetization is not reached when a magnetic field is applied, the magnetic material being (a) a solid solution of one or more ferromagnetic elements and one or more non-magnetic elements, (b) an amorphous magnetic material containing one or more strongly ferromagnetic elements and one or more non-magnetic elements, or (c) a magnetic material containing one or more types of ferromagnetic particles and one or more non-magnetic materials, the magnetic material being structured such that the ferromagnetic particles are dispersed within and supported by the non-magnetic material; (2) a device for observing a magnetic field, the device being provided with the magnetic force microscope probe of (1); and (3) a method for observing a magnetic field, the method employing the magnetic force microscope probe of (1).
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