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EVALUATION METHOD, COMBINED EVALUATION METHOD, EVALUATION DEVICE AND COMBINED EVALUATION APPARATUS

机译：评估方法，综合评估方法，评估装置和综合评估装置

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摘要

The spurious radiation of a semiconductor device is conveniently evaluated, and the spurious radiation of a device equipped with the semiconductor device is estimated. An evaluation method including causing a semiconductor device connected in parallel to a load via a load cable to perform a switching operation; measuring a common mode current flowing through the load cable during the switching operation; and outputting an evaluation comparison value for spurious radiation based on the common mode current, and an evaluation device are provided.

机译：方便地评估半导体器件的寄生辐射，并估计配备有半导体器件的器件的寄生辐射。一种评估方法，包括使经由负载电缆与负载并联连接的半导体器件进行开关操作;以及测量开关操作期间流过负载电缆的共模电流;提供一种基于共模电流的杂散放射线的评价比较值的输出装置以及评价装置。

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公开/公告号DE112018000068T5

专利类型
公开/公告日2019-05-16

原文格式PDF
申请/专利权人 FUJI ELECTRIC CO. LTD.;
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申请/专利号DE20181100068T
发明设计人 HIROKI KATSUMATA;MICHIO TAMATE;MIWAKO FUJITA;TAMIKO ASANO;YUHEI SUZUKI;TAKASHI KAIMI;YUTA SUNASAKA;TADANORI YAMADA;RYU ARAKI;BAOCONG HIU;
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申请日2018-02-08
分类号H02M1;G01R29/08;
国家 DE
入库时间 2022-08-21 11:44:28

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