首页> 外国专利> REPAIR ANALYZING SYSTEM BASED ON FAULT INFORMATION STORAGE TABLE AND REPAIR ANALYZING METHOD THEREOF

REPAIR ANALYZING SYSTEM BASED ON FAULT INFORMATION STORAGE TABLE AND REPAIR ANALYZING METHOD THEREOF

机译:基于故障信息存储表的维修分析系统及其维修分析方法

摘要

The present application relates to a repair analysis system using a defect information storage table, and to a repair analysis method thereof. According to one embodiment of the present application, the repair analysis method of a storage device using a defect information storage table comprises the steps of: generating a hash function list based on the setting of the storage device; performing a repair operation on a defective cell of the storage device using each hash function in the hash function list; and storing a hash function having a maximum spare element remaining after performing repair among each hash function in the hash function list in the defect information storage table. According to an embodiment of the present application, the repair analysis method can increase a refresh cycle without an additional storage space.
机译:本申请涉及一种使用缺陷信息存储表的维修分析系统及其维修分析方法。根据本申请的一个实施例,使用缺陷信息存储表的存储设备的修复分析方法包括以下步骤:基于存储设备的设置生成哈希函数列表;以及使用所述哈希函数列表中的每个哈希函数对所述存储设备的缺陷单元进行修复操作;在缺陷信息存储表的哈希函数列表中,将每个哈希函数之中进行修复后剩余的最大备用元素的哈希函数存储在缺陷信息存储表中。根据本申请的实施例,修复分析方法可以增加刷新周期而无需额外的存储空间。

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