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Infrared characteristics of sample using peak force tapping

机译:使用峰值力攻丝处理样品的红外特性

摘要

The present invention relates to an apparatus and method for performing sample characterization with an AFM and pulsed infrared laser indicated in the tip of a probe of an AFM. The laser pulses are synchronized with the oscillatory drive of the AFM so that the pulses tip / sample interact in only a selected oscillation cycle (i.e. every other cycle). Nano-mechanical and nano-spectroscopic measurements can be performed at resolutions of 50 nm or less, even 20 nm or less.
机译:本发明涉及用AFM和在AFM的探针的尖端中指示的脉冲红外激光进行样品表征的设备和方法。激光脉冲与AFM的振荡驱动同步,因此脉冲尖端/样本仅在选定的振荡周期(即每隔一个周期)中相互作用。可以以小于或等于50 nm,甚至小于或等于20 nm的分辨率执行纳米机械和纳米光谱测量。

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