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Infrared characteristics of sample using peak force tapping
Infrared characteristics of sample using peak force tapping
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机译:使用峰值力攻丝处理样品的红外特性
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摘要
The present invention relates to an apparatus and method for performing sample characterization with an AFM and pulsed infrared laser indicated in the tip of a probe of an AFM. The laser pulses are synchronized with the oscillatory drive of the AFM so that the pulses tip / sample interact in only a selected oscillation cycle (i.e. every other cycle). Nano-mechanical and nano-spectroscopic measurements can be performed at resolutions of 50 nm or less, even 20 nm or less.
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