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PARTICLE SIZE DISTRIBUTION MEASUREMENT APPARATUS AND PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD

机译:颗粒尺寸分布测量装置和颗粒尺寸分布测量方法

摘要

Provided are a particle size distribution measurement apparatus and a particle size distribution measurement method, by which the particle size distribution of a raw material including coarse grains and powder adhered to the coarse grains can be measured with high accuracy. This particle size distribution measurement apparatus (1) is provided with: a coarse grain measurement device (2) for acquiring information indicating the particle size distribution of coarse grains; an adhered powder measurement device (3) for acquiring information indicating the particle size distribution of adhered powder; and a calculation device (4) for calculating the particle size distribution of a raw material (13). The calculation device (4) is provided with: a coarse grain particle size distribution calculation unit (43) for calculating the particle size distribution of the coarse grains on the basis of the information, acquired by the coarse grain measurement device (2), indicating the particle size distribution of the coarse grains; an adhered powder particle size distribution calculation unit (44) for calculating the particle size distribution of the adhered powder on the basis of the information, acquired by the adhered powder measurement device (3), indicating the particle size distribution of the adhered powder; and a raw material particle size distribution calculation unit (45) for calculating the particle size distribution of the raw material (13) on the basis of both the particle size distribution of the coarse grains as calculated by the coarse grain particle size distribution calculation unit (43) and the particle size distribution of the adhered powder as calculated by the adhered powder particle size distribution calculation unit (44).
机译:提供一种粒径分布测量装置和粒径分布测量方法,通过该装置和粒径分布测量方法,可以高精度地测量包括粗大颗粒和附着在粗大颗粒上的粉末的原料的粒径分布。该粒径分布测定装置(1)具备:粗粒测定装置(2),其用于取得表示粗粒粒径分布的信息。附着粉末测定装置(3),取得表示附着粉末的粒径分布的信息。计算装置(4),用于计算原料(13)的粒径分布。计算装置(4)具备:粗粒粒径分布计算部(43),该粗粒粒径分布计算部(43)基于由粗粒测定装置(2)取得的信息,计算粗粒的粒径分布。粗粒的粒度分布;附着粉末粒径分布计算单元(44),用于基于由附着粉末测量装置(3)获取的表示附着粉末的粒径分布的信息,计算附着粉末的粒径分布;原料粒度分布计算单元(45),用于根据由粗粒度分布计算单元(2)计算出的粗粒度的两种粒度分布来计算原料(13)的粒度分布(附着粉末的粒径分布计算部(44)计算出附着粉末的粒径分布(图43)。

著录项

  • 公开/公告号WO2019193971A1

    专利类型

  • 公开/公告日2019-10-10

    原文格式PDF

  • 申请/专利权人 JFE STEEL CORPORATION;

    申请/专利号WO2019JP11533

  • 发明设计人 YAMAHIRA NAOSHI;TSUBOI TOSHIKI;

    申请日2019-03-19

  • 分类号G01N15/02;G01N21/27;

  • 国家 WO

  • 入库时间 2022-08-21 11:52:53

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