Method for degradation modeling and lifetime prediction considering recoverable shock damages

• 1. 一种冲击损伤可恢复条件下的退化建模与寿命预测方法 [P] . 中国专利： CN109977491B . 2020.11.13
• 2. 一种冲击损伤可恢复条件下的退化建模与寿命预测方法 [P] . 中国专利： CN109977491A . 2019-07-05
• 3. Degradation modeling and lifetime prediction method considering effective shocks [P] . 美国专利： US2019138926A1 . 2019-05-09

  机译： 考虑有效冲击的退化建模与寿命预测方法

• 4. PERFORMANCE DEGRADATION DICTIONARY CONSTRUCTION AND SIMILARITY-BASED BEARING LIFETIME PREDICTION METHOD [P] . WO2021088346A1 . 2021-05-14

  机译： 性能劣化词典构建与相似性的轴承寿命预测方法

• 5. Method and device for estimating damage level or lifetime prediction of a power semiconductor module comprising at least one die [P] . 日本专利： JP6552737B2 . 2019-07-31

  机译： 用于估计包括至少一个管芯的功率半导体模块的损坏程度或寿命预测的方法和装置

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