首页> 外国专利> METHOD FOR SELECTING LEADING ASSOCIATED PARAMETER AND METHOD FOR COMBINING CRITICAL PARAMETER AND LEADING ASSOCIATED PARAMETER FOR EQUIPMENT PROGNOSTICS AND HEALTH MANAGEMENT

METHOD FOR SELECTING LEADING ASSOCIATED PARAMETER AND METHOD FOR COMBINING CRITICAL PARAMETER AND LEADING ASSOCIATED PARAMETER FOR EQUIPMENT PROGNOSTICS AND HEALTH MANAGEMENT

机译:设备预测和健康管理的主要关联参数选择方法和关键参数与主要关联参数相结合的方法

摘要

The present invention provides a method for selecting a leading associated parameter. Selection is performed on data collected by a sensor, and the data is divided into a critical parameter set and another feature parameter set. From the feature parameter set, one parameter that affects beforehand in time the critical parameter is identified as a leading associated parameter. The present invention further uses the critical parameter set and the leading associated parameter to construct an equipment prognostic and health management model that effectively enhances an early warning capability.
机译:本发明提供一种用于选择前导关联参数的方法。对传感器收集的数据进行选择,并将数据分为关键参数集和另一个特征参数集。从特征参数集中,一个可以及时影响关键参数的参数被确定为领先的相关参数。本发明还使用关键参数集和主要相关参数来构建有效提高预警能力的设备预后和健康管理模型。

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