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Logic built-in self-test (LBIST) with pipeline scan enable launch on shift (LOS) flip-flop circuit
Logic built-in self-test (LBIST) with pipeline scan enable launch on shift (LOS) flip-flop circuit
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机译：具有流水线扫描功能的逻辑内置自检（LBIST）启用移位触发（LOS）触发器电路
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摘要
A logic built-in self-test (LBIST) circuit implements a pipeline scan enable launch on shift (LOS) feature. A first scan chain flip-flop has a scan enable input configured to receive a first scan enable signal. A logic circuit has a first input coupled to a data output of the first scan chain flip-flop and a second input coupled to receive the first scan enable signal. A second scan chain flip-flop has a scan input coupled to a scan output of the first scan chain flip-flop. A scan enable input of the second scan chain flip-flop is coupled to receive a second scan enable signal generated at an output of the logic circuit. The first and second scan chain flip-flops are clocked by a same clock signal.
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