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Semiconductor nanowire device having cavity spacer and method of fabricating cavity spacer for semiconductor nanowire device

机译:具有腔体间隔物的半导体纳米线器件和制造用于半导体纳米线器件的腔体间隔物的方法

摘要

Semiconductor nanowire devices having cavity spacers and methods of fabricating cavity spacers for semiconductor nanowire devices are described. For example, a semiconductor device includes a plurality of vertically stacked nanowires disposed above a substrate, each of the nanowires including a discrete channel region. A common gate electrode stack surrounds each of the discrete channel regions of the plurality of vertically stacked nanowires. A pair of dielectric spacers is on either side of the common gate electrode stack, each of the pair of dielectric spacers including a continuous material disposed along a sidewall of the common gate electrode and surrounding a discrete portion of each of the vertically stacked nanowires. A pair of source and drain regions is on either side of the pair of dielectric spacers.
机译:描述了具有空腔间隔物的半导体纳米线器件以及制造用于半导体纳米线器件的空腔间隔物的方法。例如,半导体器件包括设置在衬底上方的多个垂直堆叠的纳米线,每个纳米线包括离散的沟道区域。公共栅电极叠层围绕多个垂直堆叠的纳米线的每个离散的沟道区域。一对电介质间隔物在公共栅电极叠层的任一侧,该对电介质间隔物中的每一个都包括沿着公共栅电极的侧壁设置并围绕每个垂直堆叠的纳米线的离散部分的连续材料。一对源极和漏极区域位于该对介电间隔物的任一侧。

著录项

  • 公开/公告号US10453967B2

    专利类型

  • 公开/公告日2019-10-22

    原文格式PDF

  • 申请/专利权人 INTEL CORPORATION;

    申请/专利号US201515743575

  • 申请日2015-09-10

  • 分类号H01L29/786;H01L29/06;H01L29/423;H01L29/66;H01L27/092;H01L21/8238;B82Y10;H01L29/775;

  • 国家 US

  • 入库时间 2022-08-21 12:15:52

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