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Dynamic characteristic test apparatus and dynamic characteristic test method
Dynamic characteristic test apparatus and dynamic characteristic test method
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机译：动态特性测试装置和动态特性测试方法
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摘要
This dynamic characteristic test apparatus comprises: a power source; a reactor; a selection circuit that has first and second switching units electrically connected in series with each other, a third diode connected in parallel to the first switching unit, and a fourth diode connected in parallel to the second switching unit, and that is for selecting a first semiconductor or a second semiconductor as a subject for switching measurement; a third switching unit that switches between supplying current and stopping the supply from the power source to the first semiconductor or the second semiconductor; and a control device that controls switching between on states and off states of the switching units. A first connection part electrically connecting the first and second semiconductors with each other is electrically connected, via the reactor, to a second connection part electrically connecting the first and second switching units with each other. The control device turns on the second and third switching units when switching measurement of the first semiconductor is started, turns off the second switching unit in accordance with the end of the switching measurement of the first semiconductor, and then, turns off the third switching unit.
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