首页> 外国专利> KELVIN TEST PROBE, KELVIN TEST PROBE MODULE, AND MANUFACTURING METHOD THEREFOR

KELVIN TEST PROBE, KELVIN TEST PROBE MODULE, AND MANUFACTURING METHOD THEREFOR

机译:开尔文测试探针,开尔文测试探针模块及其制造方法

摘要

The invention relates to a probe for Kelvin Test, a probe module for Kelvin Test and a manufacturing method thereof. The probe for Kelvin Test comprises: an upper insulation sheet made of flexible material; a lower insulation sheet which is spaced apart from the upper insulation sheet in the vertical direction and which is made of flexible material; an insulation elastic member which connects the upper insulation sheet and the lower insulation sheet and which is made of elastic material; a first upper conductive pad which is formed on one surface of the upper insulation sheet; a second upper conductive pad which is formed on the other surface of the upper insulation sheet; a first upper conductive pin which is attached to the first upper conductive pad such that one portion of the first upper conductive pin protrudes above the upper insulation sheet; a second upper conductive pin which is attached to the second upper conductive pad such that one portion of the second upper conductive pin protrudes above the upper insulation sheet; a first lower conductive pad which is formed on one surface of the lower insulation sheet; a second lower conductive pad which is formed on the other surface of the lower insulation sheet; a first lower conductive pin which is attached to the first lower conductive pad such that one portion of the first lower conductive pin protrudes below the lower insulation sheet; a second lower conductive pin which is attached to the second lower conductive pad such that one portion of the second lower conductive pin protrudes below the lower insulation sheet; a first conductive wire which electrically connects the first upper conductive pad and the first lower conductive pad such that the first upper conductive pin, the first upper conductive pad, the first lower conductive pad and the first lower conductive pin form a first conductive line in the vertical direction; and a second conductive wire which electrically connects the second upper conductive pad and the second lower conductive pad such that the second upper conductive pin, the second upper conductive pad, the second lower conductive pad and the second lower conductive pin form a second conductive line in the vertical direction.
机译:本发明涉及一种用于开尔文测试的探针,一种用于开尔文测试的探针模块及其制造方法。用于开尔文测试的探针包括:由柔性材料制成的上绝缘片;下绝缘片,其在垂直方向上与上绝缘片间隔开,并且由柔性材料制成;绝缘弹性构件,其连接上绝缘片和下绝缘片并且由弹性材料制成;第一上导电垫,形成在上绝缘片的一个表面上;第二上导电垫,形成在上绝缘片的另一个表面上;第一上导电销,该第一上导电销被附接到第一上导电焊盘,使得第一上导电销的一部分突出到上绝缘片上方;第二上部导电销钉,其附接到第二上部导电垫,使得第二上部导电销钉的一部分突出到上部绝缘片上方;第一下导电垫形成在下绝缘片的一个表面上;第二下部导电垫,其形成在下部绝缘片的另一表面上;第一下部导电销钉,其被附接到第一下部导电垫,使得第一下部导电销钉的一部分突出到下部绝缘片的下方;第二下部导电销钉,其被附接到第二下部导电垫,使得第二下部导电销钉的一部分突出到下部绝缘片的下方;第一导线,其电连接第一上导电垫和第一下导电垫,以使第一上导电销,第一上导电垫,第一下导电垫和第一下导电销形成第一导线。垂直方向第二导线,其电连接第二上导电垫和第二下导电垫,使得第二上导电销,第二上导电垫,第二下导电垫和第二下导电销形成第二导线。垂直方向。

著录项

  • 公开/公告号EP3364194A4

    专利类型

  • 公开/公告日2019-10-23

    原文格式PDF

  • 申请/专利权人 INNO INC.;

    申请/专利号EP20150794805

  • 发明设计人 LEE EUN JOU;

    申请日2015-11-02

  • 分类号G01R1/067;G01R1/073;G01R3;

  • 国家 EP

  • 入库时间 2022-08-21 12:30:11

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