首页> 外国专利> Measuring device for measuring a two-dimensional or three-dimensional film topography, installation for producing a film web, method for inline pattern recognition of defect images in a two-dimensional or three-dimensional film topography. Method for controlling the production process of a film web for preventing defects, method for controlling the production process of a film web for preventing defects, method for inline flatness determination, installation for producing a film web and method for determining inline a first error, in particular flatness error

Measuring device for measuring a two-dimensional or three-dimensional film topography, installation for producing a film web, method for inline pattern recognition of defect images in a two-dimensional or three-dimensional film topography. Method for controlling the production process of a film web for preventing defects, method for controlling the production process of a film web for preventing defects, method for inline flatness determination, installation for producing a film web and method for determining inline a first error, in particular flatness error

机译：用于测量二维或三维胶片形貌的测量设备，用于生产胶片卷的设备，用于在线识别二维或三维胶片形貌中的缺陷图像的方法。控制薄膜网的生产过程以防止缺陷的方法，控制薄膜网的生产过程以防止缺陷的方法，在线平直度确定的方法，生产薄膜网的设备和在线第一误差的确定方法特定平面度误差

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摘要

The invention relates to the detection and use of a film topography of a film web produced in the blown film or cast film process for improving the quality of the film web. In particular, a film topography can be detected quantitatively with the invention. The film topography is analyzed in another aspect via a pattern recognition algorithm and optionally assigned to a defect image. This information is used to improve the quality of a film web by means of a control on the basis of error image-dependent recommendations for action and to quantitatively record the flatness of a film web. Moreover, the invention relates to an influencing element for influencing the properties of a film web at the location of the determination of the film topography.

机译：本发明涉及检测和使用在吹塑薄膜或流延薄膜方法中生产的薄膜幅材的薄膜形貌，以改善薄膜幅材的质量。特别地，利用本发明可以定量地检测膜的形貌。在另一方面，通过图案识别算法来分析胶片的形貌，并可选地将其分配给缺陷图像。该信息用于通过基于错误图像的动作建议进行控制来改善薄膜卷筒纸的质量，并定量记录薄膜卷筒纸的平整度。此外，本发明涉及一种在确定薄膜形貌的位置上影响薄膜幅材特性的影响元件。

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公开/公告号DE102017006818A1

专利类型
公开/公告日2018-03-15

原文格式PDF
申请/专利权人 REIFENHÄUSER GMBH & CO. KG MASCHINENFABRIK;
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申请/专利号DE20171006818
发明设计人 CHRISTOPH LETTOWSKY;PAUL WALACH;
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申请日2017-07-19
分类号G01B11/25;G01B11/04;B29D7/01;B29C47/92;B29C51/46;G01B11;G01L5/04;
国家 DE
入库时间 2022-08-21 12:34:20

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