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method of measuring optical properties of high power LED and apparatus for measuring optical properties of high power LED

机译:大功率LED的光学特性的测量方法以及大功率LED的光学特性的测量装置

摘要

The present invention relates to a method for measuring optical characteristics of a high-power LED and a measuring apparatus therefor, in which measurement repeatability is improved and stable measurement is possible. According to an embodiment of the present invention, there is provided a method of measuring optical characteristics of a high-power LED, comprising: obtaining a junction voltage and a junction temperature of the reference setting LED from an instant response curve of a reference setting LED; Finding a control range of the junction temperature to maintain the junction voltage constant in a stable time zone of the instantaneous response curve; Applying power to the inspection LED and controlling the temperature in a control range of the detected junction temperature so that a junction voltage of the inspection LED is kept constant in the stable time period; And measuring optical characteristics of the inspection LED in the stable time period.
机译:高功率LED的光学特性的测量方法及其测量装置技术领域本发明涉及一种高功率LED的光学特性的测量方法及其测量装置,其中,提高了测量的可重复性并且可以进行稳定的测量。根据本发明的实施例,提供了一种测量大功率LED的光学特性的方法,包括:从参考设置LED的瞬时响应曲线获得参考设置LED的结电压和结温度。 ;寻找结温的控制范围以在瞬时响应曲线的稳定时间段内保持结电压恒定;对检查用LED通电并在检测到的结温的控制范围内控制温度,以使检查用LED的结电压在稳定的时间段内保持恒定。并在稳定的时间段内测量检查LED的光学特性。

著录项

  • 公开/公告号KR101900329B1

    专利类型

  • 公开/公告日2018-09-20

    原文格式PDF

  • 申请/专利权人 광전자정밀주식회사;

    申请/专利号KR20160132563

  • 发明设计人 박성림;

    申请日2016-10-13

  • 分类号G01R31/26;G01J1/02;G01J1/42;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 12:37:08

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