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HIGH TEMPERATURE STRUCTURE FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE SYSTEM FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE USING THE SAME AND METHOD THEREOF
HIGH TEMPERATURE STRUCTURE FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE SYSTEM FOR MEASURING OF PROPERTIES OF CURVED THERMOELECTRIC DEVICE USING THE SAME AND METHOD THEREOF
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机译：用于测量弯曲热电设备性能的高温结构及其用于测量弯曲热电设备性能的系统
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摘要
The present invention relates to a high-temperature structure for measuring the characteristics of a curved thermoelectric element capable of accurately measuring the characteristics of a curved thermoelectric element in the study of a curved thermoelectric element for use in a tubular waste heat source, A high temperature structure for measuring the characteristics of a curved thermoelectric element, comprising: a plurality of cartridge heaters; And a curved surface which is in contact with a lower end of the curved thermoelectric element and has a plurality of holes for receiving the plurality of cartridge heaters, and a heating element for directly heating a lower end of the curved thermoelectric element.;
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